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Electronic Device Failure Analysis
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Scanning Electron Microscope (SEM)*
JEOL 6480 LV
- Tungsten filament emission
- Ultra-Low vacuum
- Sample size up to 12 inch in diameter
- EDS and back-scatter diffraction capability
- * Will subcontract this work
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FOURIER TRANSFORMED INFRARED (FTIR) ABSORPTION
WITH ATTENUATED TOTAL REFLECTANCE (ATR)
This instrument can measure thin layers of organic material on flat substrates, or from evaporated solvent extracts from another material. This results is an organic chemical finger print which can be searched against chemical libraries to assist in determining identity.
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